Results of test-mbed-hal-ticker

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Test Case
ARDUINO_NANO33BLE
ARDUINO_NICLA_SENSE_ME
K64F
KL25Z
LPC1768
MIMXRT1060_EVK
NUCLEO_F429ZI
NUCLEO_H563ZI
NUCLEO_H723ZG
NUCLEO_H743ZI2
NUCLEO_L452RE_P
NUCLEO_U575ZI_Q
RASPBERRY_PI_PICO
ticker initialization
ticker multiple initialization
ticker read
ticker read overflow
legacy insert event outside overflow range
legacy insert event in overflow range
legacy insert event overflow
legacy insert event head
legacy insert event tail
legacy insert event multiple overflow
test_legacy_insert_event_multiple_random
test_insert_event_us_outside_overflow_range
test_insert_event_us_in_overflow_range
test_insert_event_us_underflow
test_insert_event_us_head
test_insert_event_us_tail
test_insert_event_us_multiple_random
test_remove_event_tail
test_remove_event_head
test_remove_event_invalid
test_remove_random
update overflow guard
update overflow guard in case of spurious interrupt
test_irq_handler_single_event
test_irq_handler_single_event_spurious
test_irq_handler_multiple_event_multiple_dequeue
test_irq_handler_multiple_event_single_dequeue_overflow
test_irq_handler_multiple_event_single_dequeue
test_irq_handler_insert_immediate_in_irq
test_irq_handler_insert_non_immediate_in_irq
test_set_interrupt_past_time
test_set_interrupt_past_time_with_delay
test_frequencies_and_masks
test_ticker_max_value
test_match_interval_passed
test_match_interval_passed_table
test_suspend_resume